Study of Thermionic Emission Microscope for Multi-Beam Cathode

Shukla, S.K. and Singh, A.K. and Singh, T.P and Barik, R.K. (2019) Study of Thermionic Emission Microscope for Multi-Beam Cathode. In: Vacuum Electronic Devices and Applications, November 17-19, 2017, IIT, Roorkee. (Submitted)

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Abstract

Abstract— Thermionic emission microscope (THEM) is an important aealv,tical research feel for lying Jute electron emission uniformity of a thermionic cathode. The criticality of its design and development stems from the need to characterize the inhomogeneous emission nature of the impregnated cathode surface. In this paper, a design of the lens and the deflection plates is presented for a multi-beam cathode (MBC). To understand the electron optics of THEM with lens and deflection plates system, simulations were carried out using the simulation tools CST Particle Studio software. The present MBC contains 19 protruding buttons-each image is projected onto the screen for study.

Item Type:	Conference or Workshop Item (Paper)
Uncontrolled Keywords:	Keywords— Thermionic emission microscope (THEM), Multi-beam klystron (MBK), Multi-beam cathode (MBC), Single beam cathode (SBC), Electrostatic lens, Immersion lens, CST Particle Studio
Subjects:	Microwave Tubes > Klystrons
Divisions:	Microwave Tubes
Depositing User:	Mr. Rabin Chatterjee
Date Deposited:	04 Dec 2019 09:18
Last Modified:	04 Dec 2019 09:18
URI:	http://ceeri.csircentral.net/id/eprint/358

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